Invention Grant
- Patent Title: Method and apparatus for analyzing the concentration of materials in suspension
- Patent Title (中): 用于分析悬浮液中物质浓度的方法和装置
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Application No.: US14489244Application Date: 2014-09-17
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Publication No.: US09574993B2Publication Date: 2017-02-21
- Inventor: Mikio Sugioka
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: McDermott Will & Emery LLP
- Priority: JP2014-128971 20140624
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/31 ; G01N33/06 ; G01N33/14 ; G01N21/3577 ; G01N21/33 ; G01N21/359

Abstract:
A spectrometer equipped with an integrating sphere is used to measure a reflection spectrum from a suspension in a container when the suspension is irradiated with measurement light, of which wavelengths are selected from a wavelength range including near infrared. Reflection spectra of a number of types of standard samples, of which concentrations in the suspension are already known, are used to prepare a measurement model in accordance with an assay technique on the basis of a recursion. A concentration of the material in the suspension is found using the measurement model.
Public/Granted literature
- US20150369727A1 METHOD AND APPARATUS FOR ANALYZING THE CONCENTRATION OF MATERIALS IN SUSPENSION Public/Granted day:2015-12-24
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