Invention Grant
US09575001B2 System and method for detection of materials using orbital angular momentum signatures 有权
使用轨道角动量特征检测材料的系统和方法

System and method for detection of materials using orbital angular momentum signatures
Abstract:
An apparatus for measuring a presence of predetermined material within a sample, comprises signal generation circuitry for generating a first signal having an applied first orbital angular momentum signature and applying the first signal to the sample. A detector receives the first signal after the first signal passes through the sample and determines the presence of the predetermined material within the sample based on a detected second orbital angular momentum signature within the first signal received from the sample. The detector provides an output of an indication of the presence of the predetermined material responsive to the determination.
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