Invention Grant
- Patent Title: System and method for detection of materials using orbital angular momentum signatures
- Patent Title (中): 使用轨道角动量特征检测材料的系统和方法
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Application No.: US14942641Application Date: 2015-11-16
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Publication No.: US09575001B2Publication Date: 2017-02-21
- Inventor: Solyman Ashrafi , Roger Linquist
- Applicant: NXGEN PARTNERS IP, LLC
- Applicant Address: US TX Dallas
- Assignee: NxGen Partners IP, LLC
- Current Assignee: NxGen Partners IP, LLC
- Current Assignee Address: US TX Dallas
- Agency: Howison & Arnott, LLP
- Main IPC: G01N21/59
- IPC: G01N21/59 ; G01N24/00 ; G01R33/36 ; G01N21/17 ; G01N33/483

Abstract:
An apparatus for measuring a presence of predetermined material within a sample, comprises signal generation circuitry for generating a first signal having an applied first orbital angular momentum signature and applying the first signal to the sample. A detector receives the first signal after the first signal passes through the sample and determines the presence of the predetermined material within the sample based on a detected second orbital angular momentum signature within the first signal received from the sample. The detector provides an output of an indication of the presence of the predetermined material responsive to the determination.
Public/Granted literature
- US20160069804A1 SYSTEM AND METHOD FOR DETECTION OF MATERIALS USING ORBITAL ANGULAR MOMENTUM SIGNATURES Public/Granted day:2016-03-10
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