Invention Grant
- Patent Title: Material determination by sweeping a range of frequencies
- Patent Title (中): 通过扫描频率范围进行材料确定
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Application No.: US14578760Application Date: 2014-12-22
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Publication No.: US09575014B2Publication Date: 2017-02-21
- Inventor: Alan H. Leek , Damian M. Szmulewicz
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent John R. Pessetto; Charles A. Brill; Frank D. Cimino
- Main IPC: G01R27/26
- IPC: G01R27/26 ; G01N27/00 ; G01N22/00 ; G01B3/02 ; H04B17/12

Abstract:
A material-discerning device is arranged to include an antenna, a proximity sensor, a band pass filter and a processor. The antenna radiates a radio-frequency signal and a material object is located in the field created by the antenna and near the proximity sensor. Change in the amplitude of the radio-frequency signal due to the presence of the material object is detected by the proximity sensor. The change in amplitude of the radio-frequency signal is stored. The frequency of the radio-frequency signal is changed and the process is repeated until a range of frequencies have been swept and stored. After the range of frequencies has been swept and stored, the processor determines the type of material of the material object using the results of the changes in amplitude of the radio-frequency signals.
Public/Granted literature
- US20160178537A1 MATERIAL DETERMINATION BY SWEEPING A RANGE OF FREQUENCIES Public/Granted day:2016-06-23
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