Invention Grant
- Patent Title: Heat generation point detection method and heat generation point detection device
- Patent Title (中): 发热点检测方法和发热点检测装置
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Application No.: US14232021Application Date: 2012-07-11
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Publication No.: US09575020B2Publication Date: 2017-02-21
- Inventor: Tomonori Nakamura
- Applicant: Tomonori Nakamura
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Agency: Drinker Biddle & Reath LLP
- Priority: JP2011-154855 20110713
- International Application: PCT/JP2012/067706 WO 20120711
- International Announcement: WO2013/008850 WO 20130117
- Main IPC: G01K7/00
- IPC: G01K7/00 ; G01N25/72 ; G01R31/311 ; H01L23/34

Abstract:
A heat generation point detection method comprises steps S01, S02 of applying a low frequency bias voltage to an integrated circuit S and acquiring a heat generation detection signal detected from the integrated circuit S in response thereto, steps S03, S04 of supplying a high frequency bias voltage to the integrated circuit S and acquiring a heat generation detection signal detected from the integrated circuit S in response thereto, steps S05 to S07 of detecting a phase shift between the low frequency bias voltage and the heat generation detection signal and a phase shift between the high frequency bias voltage and the heat generation detection signal, and a step S08 of calculating a change rate of the phase shift against a square root of the frequency of the bias voltage, based on those phase shifts, and acquiring depth information of a heat generation point from the change rate.
Public/Granted literature
- US20140169403A1 HEAT GENERATION POINT DETECTION METHOD AND HEAT GENERATION POINT DETECTION DEVICE Public/Granted day:2014-06-19
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