Invention Grant
- Patent Title: Automatic analysis device and automatic analysis method
- Patent Title (中): 自动分析装置及自动分析方法
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Application No.: US14786234Application Date: 2014-06-05
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Publication No.: US09575082B2Publication Date: 2017-02-21
- Inventor: Sakuichiro Adachi , Hajime Yamazaki , Masahiko Iijima , Shigeki Matsubara
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2013-128608 20130619
- International Application: PCT/JP2014/064971 WO 20140605
- International Announcement: WO2014/203741 WO 20141224
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N15/06 ; G01N33/00 ; G01N33/48 ; G01N35/00 ; G01N21/82 ; G01N21/51 ; G01N21/59

Abstract:
The automatic analysis device includes an analysis unit that corrects, based on a measured value at the time of a first light amount measurement with water dispensed in the reaction cell before the sample is dispensed therein; a measured value at the time of a second light amount measurement after the sample and a preprocessing reagent are dispensed into the reaction cell; a liquid amount in the reaction cell at the time of the second light amount measurement; and a liquid amount in the reaction cell at the time of a third light amount measurement after the reaction reagent has been dispensed into the reaction cell and before the reaction reagent and the substance to be measured react with each other.
Public/Granted literature
- US20160077119A1 AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD Public/Granted day:2016-03-17
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