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US09575090B2 Force measurement with real-time baseline determination 有权
力测量与实时基线测定

Force measurement with real-time baseline determination
Abstract:
An atomic force microscope (AFM) and corresponding method to provide low force (sub-20 pN) AFM control and mechanical property measurement is provided. The preferred embodiments employ real-time false deflection correction/discrimination by adaptively modifying the drive ramp to accommodate to deflection artifacts.
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