Invention Grant
- Patent Title: Integrated circuit and associated methods for measurement of an external impedance
- Patent Title (中): 用于测量外部阻抗的集成电路和相关方法
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Application No.: US14291597Application Date: 2014-05-30
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Publication No.: US09575103B2Publication Date: 2017-02-21
- Inventor: Glenn A. Forrest , Wei Zhang
- Applicant: Allegro Microsystems, LLC
- Applicant Address: US MA Worcester
- Assignee: ALLEGRO MICROSYSTEMS, LLC
- Current Assignee: ALLEGRO MICROSYSTEMS, LLC
- Current Assignee Address: US MA Worcester
- Agency: Daly, Crowley, Mofford & Durkee, LLP
- Main IPC: G01R27/08
- IPC: G01R27/08 ; G01R27/02 ; G01R31/28 ; G01R27/20

Abstract:
An integrated circuit includes an output circuit having a first terminal adapted to couple to an external power supply, a second terminal adapted to couple to a reference potential, and a third, control terminal. The first and second terminals of the output circuit provide output terminals of the integrated circuit. The integrated circuit further includes an impedance measurement circuit responsive to the external power supply to generate a control signal for coupling to the control terminal of the output circuit. The control signal controls a current level associated with the output circuit. A corresponding method is also described.
Public/Granted literature
- US20150346252A1 INTEGRATED CIRCUIT AND ASSOCIATED METHODS FOR MEASUREMENT OF AN EXTERNAL IMPEDANCE Public/Granted day:2015-12-03
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