Invention Grant
- Patent Title: Scan chain processing in a partially functional chip
- Patent Title (中): 扫描链处理部分功能芯片
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Application No.: US13853592Application Date: 2013-03-29
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Publication No.: US09575120B2Publication Date: 2017-02-21
- Inventor: Steven M. Douskey , Ronald E. Fuhs
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Nicholas D. Bowman
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/3177 ; G06F11/26 ; G06F11/22
Abstract:
A method for scanning a partially functional chip. The method may include applying a failed core map to the partially functional chip, bypassing at least one failed core scan chain, based on contents of the failed core map. The method may also include performing comparisons of scan status information to the failed core map and inhibiting movement of scan data of at least one failed core, based on results of the comparisons.
Public/Granted literature
- US20140298124A1 SCAN CHAIN PROCESSING IN A PARTIALLY FUNCTIONAL CHIP Public/Granted day:2014-10-02
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