Invention Grant
- Patent Title: Flat panel X-ray detector
- Patent Title (中): 平板X射线探测器
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Application No.: US14063018Application Date: 2013-10-25
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Publication No.: US09575190B2Publication Date: 2017-02-21
- Inventor: Chih-Hao Wu
- Applicant: InnoLux Corporation
- Applicant Address: TW
- Assignee: INNOLUX CORPORATION
- Current Assignee: INNOLUX CORPORATION
- Current Assignee Address: TW
- Agency: Bacon & Thomas, PLLC
- Priority: TW101143908A 20121123
- Main IPC: G01T1/20
- IPC: G01T1/20

Abstract:
The present invention relates to a flat panel X-ray detector, which comprises a thin film transistor (TFT) substrate; a photoelectric detecting layer, which is disposed on and electrically connected with the TFT substrate, wherein the photoelectric detecting layer comprises a plurality of photoelectric detecting units and a plurality of light absorption units, and the light absorption unit is disposed between spaces adjacent to the photoelectric detecting unit; a Scintillation layer, which is disposed on the photoelectric detecting layer; and a reflective layer, which is disposed on the Scintillation layer.
Public/Granted literature
- US20140145085A1 FLAT PANEL X-RAY DETECTOR Public/Granted day:2014-05-29
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