Invention Grant
US09575417B2 Exposure apparatus including a mask holding device which holds a periphery area of a pattern area of the mask from above 有权
曝光装置,包括从上方保持面罩的图案区域的周边区域的面罩保持装置

  • Patent Title: Exposure apparatus including a mask holding device which holds a periphery area of a pattern area of the mask from above
  • Patent Title (中): 曝光装置,包括从上方保持面罩的图案区域的周边区域的面罩保持装置
  • Application No.: US14245050
    Application Date: 2014-04-04
  • Publication No.: US09575417B2
    Publication Date: 2017-02-21
  • Inventor: Yuichi Shibazaki
  • Applicant: NIKON CORPORATION
  • Applicant Address: JP Tokyo
  • Assignee: NIKON CORPORATION
  • Current Assignee: NIKON CORPORATION
  • Current Assignee Address: JP Tokyo
  • Agency: Oliff PLC
  • Priority: JP2010-277937 20101214
  • Main IPC: A61N5/00
  • IPC: A61N5/00 G03F7/20 H01L21/027
Exposure apparatus including a mask holding device which holds a periphery area of a pattern area of the mask from above
Abstract:
An exposure apparatus which transfers a pattern formed on a mask onto a photosensitive substrate placed in proximity to the mask, the apparatus including an illumination optical device which illuminates the mask with an energy beam, a mask holding device which holds a periphery area of a pattern area of the mask from above, and makes a force at least within a plane parallel to a predetermined plane act on the mask and a substrate holding device which moves along the predetermined plane holding the substrate.
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