Invention Grant
US09575417B2 Exposure apparatus including a mask holding device which holds a periphery area of a pattern area of the mask from above
有权
曝光装置,包括从上方保持面罩的图案区域的周边区域的面罩保持装置
- Patent Title: Exposure apparatus including a mask holding device which holds a periphery area of a pattern area of the mask from above
- Patent Title (中): 曝光装置,包括从上方保持面罩的图案区域的周边区域的面罩保持装置
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Application No.: US14245050Application Date: 2014-04-04
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Publication No.: US09575417B2Publication Date: 2017-02-21
- Inventor: Yuichi Shibazaki
- Applicant: NIKON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NIKON CORPORATION
- Current Assignee: NIKON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2010-277937 20101214
- Main IPC: A61N5/00
- IPC: A61N5/00 ; G03F7/20 ; H01L21/027

Abstract:
An exposure apparatus which transfers a pattern formed on a mask onto a photosensitive substrate placed in proximity to the mask, the apparatus including an illumination optical device which illuminates the mask with an energy beam, a mask holding device which holds a periphery area of a pattern area of the mask from above, and makes a force at least within a plane parallel to a predetermined plane act on the mask and a substrate holding device which moves along the predetermined plane holding the substrate.
Public/Granted literature
- US20140218707A1 EXPOSURE METHOD AND EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD Public/Granted day:2014-08-07
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