- Patent Title: Method and device for reducing poor linearity in location detection
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Application No.: US15286008Application Date: 2016-10-05
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Publication No.: US09575596B2Publication Date: 2017-02-21
- Inventor: Shang-Tai Yeh
- Applicant: EGALAX_EMPIA TECHNOLOGY INC.
- Applicant Address: TW Taipei
- Assignee: EGALAX_EMPIA TECHNOLOGY INC.
- Current Assignee: EGALAX_EMPIA TECHNOLOGY INC.
- Current Assignee Address: TW Taipei
- Agency: WPAT, PC
- Agent Justin King
- Priority: TW101150822A 20121228
- Main IPC: G06F3/041
- IPC: G06F3/041 ; G06F3/044
Abstract:
The changes of capacitances of a plurality of detecting locations on a touch screen are detected for determining a profile corresponding to each external object approaching or touching the touch screen. Then the location of each external object is generated separately by two or four values in the corresponding profile.
Public/Granted literature
- US20170024079A1 METHOD AND DEVICE FOR LOCATION DETECTION Public/Granted day:2017-01-26
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