Invention Grant
- Patent Title: Method for setting breakpoints, and an integrated circuit and debug tool therefor
- Patent Title (中): 断点设置方法及其集成电路及调试工具
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Application No.: US13879240Application Date: 2010-11-22
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Publication No.: US09575758B2Publication Date: 2017-02-21
- Inventor: Alistair Robertson , Mark Maiolani
- Applicant: Alistair Robertson , Mark Maiolani
- Applicant Address: US TX Austin
- Assignee: NXP USA, INC.
- Current Assignee: NXP USA, INC.
- Current Assignee Address: US TX Austin
- International Application: PCT/IB2010/055324 WO 20101122
- International Announcement: WO2012/069872 WO 20120531
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F9/00 ; G06F9/30 ; G06F11/36

Abstract:
A method for setting one or more breakpoints within executable program code of an embedded device is described. The method comprises copying at least one area of non-volatile memory (NVM) of the embedded device, comprising at least one instruction at which a breakpoint is to be set, into at least one area of overlay memory replacing within the overlay memory the at least one instruction at which a breakpoint is to be set with a breakpoint operation code, and enabling a mapping of the at least one area of NVM, comprising the at least one instruction at which a breakpoint is to be set, to the at least one area of overlay memory during execution of the program code within the embedded device.
Public/Granted literature
- US20130227256A1 METHOD FOR SETTING BREAKPOINTS, AND AN INTEGRATED CIRCUIT AND DEBUG TOOL THEREFOR Public/Granted day:2013-08-29
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