Invention Grant
US09575860B2 Apparatus and a method for memory testing by a programmable circuit in a safety critical system
有权
用于通过安全关键系统中的可编程电路进行存储器测试的装置和方法
- Patent Title: Apparatus and a method for memory testing by a programmable circuit in a safety critical system
- Patent Title (中): 用于通过安全关键系统中的可编程电路进行存储器测试的装置和方法
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Application No.: US14082655Application Date: 2013-11-18
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Publication No.: US09575860B2Publication Date: 2017-02-21
- Inventor: Ferenc Staengler
- Applicant: Ferenc Staengler
- Applicant Address: FO Helsinki
- Assignee: Kone Corporation
- Current Assignee: Kone Corporation
- Current Assignee Address: FO Helsinki
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: EP12195266 20121203
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/27 ; G11C29/08

Abstract:
The invention relates to a method and apparatus. In the method, a programmable random access memory testing circuit detects a signal to initiate testing of at least one random access memory circuit, the testing circuit being connected to a bus to which a processor and the at least one memory circuit is connected, the at least one memory circuit comprising at least a first memory block. The testing circuit determines that the bus is not reserved and reserves the bus. The testing circuit reads application data in a first memory block to a temporary memory of the testing circuit. The testing circuit executes marching test for the first memory block in a memory circuit. The testing circuit returns the application data back to the first memory block in the memory circuit. The testing circuit releases the bus.
Public/Granted literature
- US20140164834A1 APPARATUS AND A METHOD FOR MEMORY TESTING BY A PROGRAMMABLE CIRCUIT IN A SAFETY CRITICAL SYSTEM Public/Granted day:2014-06-12
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