A semiconductor device includes: an electric fuse circuit including first electric fuses used as data bits and second electric fuses used as polarity bits; and a write circuit configured to selectively pass a current through the first electric fuses and the second electric fuses and thereby write data in the electric fuse circuit. The write circuit is configured to perform a first process when number of write bits included in write data is larger than a value obtained by dividing total number of bits in the write data by 2. The first process includes writing of inverted write data in a plurality of first electric fuses, and including writing of inversion data in one of the second electric fuses. The plurality of first electric fuses are part of the first electric fuses. The inverted write data is inverted data of the write data. The inversion data represents inversion.