Invention Grant
- Patent Title: Semiconductor system having semiconductor apparatus and method of determining delay amount using the semiconductor apparatus
- Patent Title (中): 具有半导体装置的半导体系统和使用半导体装置确定延迟量的方法
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Application No.: US14981284Application Date: 2015-12-28
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Publication No.: US09576936B2Publication Date: 2017-02-21
- Inventor: Tae Sik Yun , Sang Jin Byeon
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si
- Assignee: SK HYNIX INC.
- Current Assignee: SK HYNIX INC.
- Current Assignee Address: KR Icheon-si
- Agency: William Park & Associates Ltd.
- Priority: KR10-2012-0025391 20120313
- Main IPC: H03K19/00
- IPC: H03K19/00 ; H01L25/065 ; H03K19/003 ; H03K17/14 ; G01R31/28

Abstract:
A semiconductor apparatus includes: a slave chip including a signal transfer unit configured to determine whether or not to transfer an input signal in response to a chip select signal; a master chip including a replica circuit unit having the same configuration as the signal transfer unit and a signal output unit configured to receive an output signal of the signal transfer unit and an output signal of the replica circuit unit and generate an output signal in response to the control signal; a first through-chip via vertically formed through the slave chip, and having one end connected to the master chip to receive the input signal and the other end connected to the signal transfer unit; and a second through-chip via vertically formed through the slave chip, and having one end connected to the signal transfer unit and the other end connected to the signal output unit.
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