Invention Grant
US09576936B2 Semiconductor system having semiconductor apparatus and method of determining delay amount using the semiconductor apparatus 有权
具有半导体装置的半导体系统和使用半导体装置确定延迟量的方法

Semiconductor system having semiconductor apparatus and method of determining delay amount using the semiconductor apparatus
Abstract:
A semiconductor apparatus includes: a slave chip including a signal transfer unit configured to determine whether or not to transfer an input signal in response to a chip select signal; a master chip including a replica circuit unit having the same configuration as the signal transfer unit and a signal output unit configured to receive an output signal of the signal transfer unit and an output signal of the replica circuit unit and generate an output signal in response to the control signal; a first through-chip via vertically formed through the slave chip, and having one end connected to the master chip to receive the input signal and the other end connected to the signal transfer unit; and a second through-chip via vertically formed through the slave chip, and having one end connected to the signal transfer unit and the other end connected to the signal output unit.
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