Invention Grant
- Patent Title: Magnetoresistance effect element and magnetic memory
- Patent Title (中): 磁阻效应元件和磁存储器
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Application No.: US15029860Application Date: 2014-10-20
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Publication No.: US09577182B2Publication Date: 2017-02-21
- Inventor: Shoji Ikeda , Hideo Sato , Shunsuke Fukami , Michihiko Yamanouchi , Fumihiro Matsukura , Hideo Ohno , Shinya Ishikawa
- Applicant: TOHOKU UNIVERSITY
- Applicant Address: JP Sendai-shi
- Assignee: TOHOKU UNIVERSITY
- Current Assignee: TOHOKU UNIVERSITY
- Current Assignee Address: JP Sendai-shi
- Agency: Oliff PLC
- Priority: JP2013-219675 20131022
- International Application: PCT/JP2014/077816 WO 20141020
- International Announcement: WO2015/060239 WO 20150430
- Main IPC: H01L43/08
- IPC: H01L43/08 ; G11C11/16 ; H01L43/02 ; H01L27/22

Abstract:
A magnetoresistance effect element and a magnetic memory having thermal stability expressed by a thermal stability factor of 70 or more even with a fine junction size. The magnetoresistance effect element includes a first magnetic layer of an invariable magnetization direction forming a reference layer, a second magnetic layer of a variable magnetization direction forming a recording layer, and a first non-magnetic layer disposed between the first and second magnetic layers in a thickness direction of the first and second magnetic layers. At least one of the first and second magnetic layers has the following relationship between D (nm) and t (nm): D
Public/Granted literature
- US20160233416A1 MAGNETORESISTANCE EFFECT ELEMENT AND MAGNETIC MEMORY Public/Granted day:2016-08-11
Information query
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