Invention Grant
- Patent Title: Beam forming system having linear samplers
- Patent Title (中): 具有线性采样器的光束成像系统
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Application No.: US14256216Application Date: 2014-04-18
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Publication No.: US09577328B2Publication Date: 2017-02-21
- Inventor: Matthew A. Morton , Jonathan P. Comeau , Anthony Kopa
- Applicant: Raytheon Company
- Applicant Address: US MA Waltham
- Assignee: RAYTHEON COMPANY
- Current Assignee: RAYTHEON COMPANY
- Current Assignee Address: US MA Waltham
- Agency: Daly, Crowley, Mofford & Durkee, LLP
- Main IPC: H01Q3/26
- IPC: H01Q3/26 ; H03D7/00 ; H03D7/16 ; H01Q3/00

Abstract:
A frequency conversion circuit having a plurality of N signal channels, each being fed an input signal and a train of pluses having a period T and a duty cycle T/N. Each channel includes: a sampler coupled the input signal and being responsive to sampling signals; and a controllable time delay for producing the train of sampling signals in response to the train of pulses, the time delay imparting a time delay to the pulses in accordance with a time delay command signal fed to the time delay. Each one of the sampling signals is produced by the time delay in each one of the channels with the period T and the duty cycle T/N with the sampling signals in one of the trains of the sampling signals being delayed with respect to the sampling signals in another one of the trains the sampling signals a time T/N.
Public/Granted literature
- US20150303567A1 BEAM FORMING SYSTEM HAVING LINEAR SAMPLERS Public/Granted day:2015-10-22
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