Invention Grant
- Patent Title: Image sensor defect identification using optical flare
- Patent Title (中): 使用光学耀斑的图像传感器缺陷识别
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Application No.: US14836496Application Date: 2015-08-26
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Publication No.: US09578266B2Publication Date: 2017-02-21
- Inventor: Ilia Ovsiannikov
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: H04N7/18
- IPC: H04N7/18 ; H04N5/365 ; H04N5/367 ; H01L27/146
Abstract:
Embodiments described herein may operate to compare an illuminance corresponding to a signal from an image sensor array (ISA) element in a production imaging system with an illuminance associated with optical flare incident to an ISA from which the ISA element is selected. The ISA element may be identified as unusable if the illuminance corresponding to the signal from the ISA element is less than the illuminance associated with the optical flare incident to the ISA.
Public/Granted literature
- US20150365614A1 IMAGE SENSOR DEFECT IDENTIFICATION USING OPTICAL FLARE Public/Granted day:2015-12-17
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