Invention Grant
- Patent Title: Method and apparatus for polishing a substrate
- Patent Title (中): 抛光基板的方法和装置
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Application No.: US13548361Application Date: 2012-07-13
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Publication No.: US09579768B2Publication Date: 2017-02-28
- Inventor: Yasuyuki Motoshima , Toru Maruyama , Hisanori Matsuo
- Applicant: Yasuyuki Motoshima , Toru Maruyama , Hisanori Matsuo
- Applicant Address: JP Tokyo
- Assignee: EBARA CORPORATION
- Current Assignee: EBARA CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2011-158080 20110719; JP2011-245482 20111109
- Main IPC: B24B49/14
- IPC: B24B49/14 ; B24B37/015 ; B24B55/02 ; B24B37/34 ; B24B53/017

Abstract:
A polishing apparatus polishes a surface of a substrate by pressing the substrate against a polishing pad on a polishing table. The polishing apparatus is configured to control a temperature of the polishing surface of the polishing pad by blowing a gas on the polishing pad during polishing. The polishing apparatus includes a pad temperature control mechanism having at least one gas ejection nozzle for ejecting a gas toward the polishing pad and configured to blow the gas onto the polishing pad to control a temperature of the polishing pad, and an atomizer having at least one nozzle for ejecting a liquid or a mixed fluid of a gas and a liquid and configured to blow the liquid or the mixed fluid onto the polishing pad to remove foreign matters on the polishing pad. The pad temperature control mechanism and the atomizer are formed into an integral unit.
Public/Granted literature
- US20130023186A1 METHOD AND APPARATUS FOR POLISHING A SUBSTRATE Public/Granted day:2013-01-24
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