Invention Grant
- Patent Title: Sample analyzer and method for controlling sample analyzer
- Patent Title (中): 样品分析仪和样品分析仪控制方法
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Application No.: US13629000Application Date: 2012-09-27
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Publication No.: US09581608B2Publication Date: 2017-02-28
- Inventor: Makoto Ueda , Yuji Wakamiya , Toshikatsu Fukuju , Kazunori Mototsu
- Applicant: SYSMEX CORPORATION
- Applicant Address: JP Hyogo
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Hyogo
- Agency: Sughrue Mion, PLLC
- Priority: JP2011-212900 20110928
- Main IPC: G01N33/566
- IPC: G01N33/566 ; C12Q1/70 ; C12M1/34 ; G01N33/50 ; G01N35/00 ; G01N35/02 ; G01N35/04

Abstract:
A sample analyzer transports a first rack and a second rack, the first rack including a first number of supporters for supporting containers that contain biological samples of subjects, and the second rack including a second number of supporters for supporting containers that contain standard samples. The sample analyzer determines whether a transport object is the first rack or the second rack. When it has been determined that the transport object is the second rack, the sample analyzer performs a transporting operation according to the second rack and measure the standard samples in the containers supported by the second rack in a predetermined order, and prepares a calibration curve used for analyzing a measurement result of a biological sample, based on a plurality of measurement results of the standard samples.
Public/Granted literature
- US20130078617A1 SAMPLE ANALYZER AND METHOD FOR CONTROLLING SAMPLE ANALYZER Public/Granted day:2013-03-28
Information query
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