Invention Grant
- Patent Title: Modular atomic force microscope with environmental controls
- Patent Title (中): 模块化原子力显微镜与环境控制
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Application No.: US14817517Application Date: 2015-08-04
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Publication No.: US09581616B2Publication Date: 2017-02-28
- Inventor: Mario Viani , Roger Proksch , Maarten Rutgers , Jason Cleveland , Jim Hodgson
- Applicant: Oxford Instruments Asylum Research, Inc.
- Applicant Address: US CA Goleta
- Assignee: Oxford Instruments Asylum Research, Inc
- Current Assignee: Oxford Instruments Asylum Research, Inc
- Current Assignee Address: US CA Goleta
- Agency: Law Office of Scott C Harris, Inc
- Main IPC: G01Q30/20
- IPC: G01Q30/20 ; G01Q30/18 ; G01Q10/00 ; G01Q30/10 ; G01Q30/12
Abstract:
A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.
Public/Granted literature
- US20150338438A1 Modular Atomic Force Microscope with Environmental Controls Public/Granted day:2015-11-26
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