Invention Grant
- Patent Title: Methods and circuits for testing partial circuit designs
- Patent Title (中): 用于测试部分电路设计的方法和电路
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Application No.: US14924131Application Date: 2015-10-27
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Publication No.: US09581643B1Publication Date: 2017-02-28
- Inventor: Graham F. Schelle , Yi-Hua E. Yang , Paul R. Schumacher , Patrick Lysaght
- Applicant: Xilinx, Inc.
- Applicant Address: US CA San Jose
- Assignee: XILINX, INC.
- Current Assignee: XILINX, INC.
- Current Assignee Address: US CA San Jose
- Agent LeRoy D. Maunu
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G01R31/317 ; G01R31/3177

Abstract:
Methods and circuits are disclosed for testing a partial circuit design including circuit modules having a set of ports configured to be driven by signals from ports of one or more circuits omitted from the partial circuit. The set of ports are identified by identifying ports that are not connected by a net to another port or input/output (I/O) pin in the circuit design and that form inputs to slave circuits in the circuit modules. A traffic generator circuit is added to the partial design to form a test circuit design. The traffic generator circuit is configured to provide to the set of ports respective input data signals having a pattern consistent with master-to-slave communication. Operation of a test circuit design is modeled. A set of data signals generated by the circuit modules during the modeled operation of the test circuit design is captured and stored.
Information query