Invention Grant
US09581722B2 Apparatus and method for noninvasively determining positioning of a component beneath a substrate
有权
用于非侵入性地确定组件在基底下方的定位的装置和方法
- Patent Title: Apparatus and method for noninvasively determining positioning of a component beneath a substrate
- Patent Title (中): 用于非侵入性地确定组件在基底下方的定位的装置和方法
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Application No.: US14728716Application Date: 2015-06-02
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Publication No.: US09581722B2Publication Date: 2017-02-28
- Inventor: Matthew Neal
- Applicant: Matthew Neal
- Applicant Address: US VA Falls Church
- Assignee: Northrop Grumman Systems Corporation
- Current Assignee: Northrop Grumman Systems Corporation
- Current Assignee Address: US VA Falls Church
- Agency: Tarolli, Sundheim, Covell & Tummino LLP
- Main IPC: G01V5/00
- IPC: G01V5/00 ; B64F5/00 ; F16B1/00

Abstract:
A method of noninvasively determining desired positioning of a component beneath a substrate is described. The component has a concealing surface longitudinally separated by a substrate body from an accessible surface of the substrate. A component having longitudinally differing activated and deactivated positions is provided. The component is located longitudinally beneath the concealing surface of the substrate. The accessible surface of the substrate is inspected with an inspection device while the component is beneath the concealing surface. With the inspection device, at least one of an activated and a deactivated position of the component is detected. The detected activated and/or deactivated position of the component is indicated, in a user-perceptible format. An apparatus for noninvasively determining desired positioning of a component beneath a substrate is also provided.
Public/Granted literature
- US20160356916A1 APPARATUS AND METHOD FOR NONINVASIVELY DETERMINING POSITIONING OF A COMPONENT BENEATH A SUBSTRATE Public/Granted day:2016-12-08
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