Invention Grant
US09583161B1 Repair circuit, memory apparatus using the same and operating method thereof
有权
修理电路,使用其的存储装置及其操作方法
- Patent Title: Repair circuit, memory apparatus using the same and operating method thereof
- Patent Title (中): 修理电路,使用其的存储装置及其操作方法
-
Application No.: US15246614Application Date: 2016-08-25
-
Publication No.: US09583161B1Publication Date: 2017-02-28
- Inventor: Yong Seop Kim , Ji Hyae Bae , Min Chul Shin , Jun Gi Choi
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si
- Agency: William Parker & Associates Ltd.
- Priority: KR10-2016-0018511 20160217
- Main IPC: G11C17/18
- IPC: G11C17/18 ; G11C7/22 ; G11C8/08 ; G11C8/10 ; G11C29/00 ; G11C17/16

Abstract:
A memory apparatus includes a first memory bank, a second memory bank, a row decoder and repair circuit, and an input/output driver controller. The row decoder and repair circuit is coupled to the first and second memory banks in common. The row decoder and repair circuit generates a shared repair signal according to whether a word line disposed in a first memory bank is replaced with a word line disposed in a second memory bank. The input/output driver controller allows read or write operations for one of the first and second memory banks to be performed based on the shared repair signal and an operation signal.
Information query