Invention Grant
- Patent Title: Analysis device
- Patent Title (中): 分析装置
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Application No.: US14432812Application Date: 2013-07-08
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Publication No.: US09586205B2Publication Date: 2017-03-07
- Inventor: Minoru Asogawa , Yoshinori Mishina , Yasuo Iimura , Hisashi Hagiwara
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP2012-219262 20121001
- International Application: PCT/JP2013/004213 WO 20130708
- International Announcement: WO2014/054207 WO 20140410
- Main IPC: G01N27/00
- IPC: G01N27/00 ; B01L3/00 ; G01N27/447 ; G01N35/00 ; B01L7/00

Abstract:
An analysis chip device according to an exemplary embodiment of the present invention includes a placing board (17) on which a microchip (14) is placed, and a coupling (20) attached to a cover (11) of the microchip (14). The coupling (20) includes a linear electrode (25), a sleeve (22) including an attach part (28) that is attached to the cover (11) and an air core part (23) in which the electrode (25) is provided, the sleeve (22) having a side surface in which an inlet port (26) is provided, the inlet port (26) communicating with the air core part (23); and a holder (21) including a pipe connection part (27) to which a pipe (32) is connected, the pipe (32) supplying gas to the inlet port (26), the holder (21) holding the sleeve (22) so as to surround the inlet port (26).
Public/Granted literature
- US20150251180A1 ANALYSIS DEVICE Public/Granted day:2015-09-10
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