There is provided a semiconductor device which can provide desired output characteristics suitable to applications. A semiconductor device 10 includes a temperature sensing unit 11 which generates an analog sensing signal corresponding to a temperature, and an AD converter unit 12 which converts the analog sensing signal into a digital output signal corresponding to an adjusted temperature change rate based on a temperature change rate adjustment signal for adjusting the temperature change rate. The temperature change rate refers to a change in a detected temperature per bit of a digital output signal.