Invention Grant
- Patent Title: Methods for performing thermal melt analysis
- Patent Title (中): 进行热熔融分析的方法
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Application No.: US13956060Application Date: 2013-07-31
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Publication No.: US09588069B2Publication Date: 2017-03-07
- Inventor: David Opalsky , Norbert D. Hagen , Rolf Silbert , Sean Siyao Chiu , Haitao Li
- Applicant: Gen-Probe Incorporated
- Applicant Address: US CA San Diego
- Assignee: GEN-PROBE INCORPORATED
- Current Assignee: GEN-PROBE INCORPORATED
- Current Assignee Address: US CA San Diego
- Agent Charles B. Cappellari; David L. Devernoe; Richard Wydeven
- Main IPC: C12Q1/68
- IPC: C12Q1/68 ; G01N25/04 ; B01L7/00 ; G01N21/64 ; B01L9/06
Abstract:
The present disclosure provides apparatus, systems, and methods for conducting rapid, accurate, and consistent heated amplifications and/or thermal melt analyses.
Public/Granted literature
- US20140038170A1 APPARATUS, SYSTEMS, AND METHODS FOR PERFORMING THERMAL MELT ANALYSES AND AMPLIFICATIONS Public/Granted day:2014-02-06
Information query
