Invention Grant
- Patent Title: Stun device testing apparatus and methods
- Patent Title (中): 眩晕设备测试仪器及方法
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Application No.: US14036587Application Date: 2013-09-25
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Publication No.: US09588165B2Publication Date: 2017-03-07
- Inventor: Stephen Burns , Bruno D.V. Marino , Kenneth J. Stethem
- Applicant: Aegis Industries, Inc.
- Applicant Address: US MD Rockville
- Assignee: AEGIS INDUSTRIES, INC.
- Current Assignee: AEGIS INDUSTRIES, INC.
- Current Assignee Address: US MD Rockville
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R19/00 ; F41B15/04 ; G01R31/02 ; F41A17/06 ; F41H13/00 ; H05C3/00

Abstract:
A method of testing an electric discharge stun device includes the steps of identifying a stun device to be tested and absorbing a discharge from the stun device into a tester. The discharge is characterized by a discharge characteristic that is then compared automatically to information such as (a) a previous corresponding characteristic associated with a previous discharge of the stun device or (b) a corresponding characteristic associated with a prior discharge of at least one other stun device. The characteristic can be a waveform, a peak voltage, duration, current, joule, and temperature.
Public/Granted literature
- US20140025328A1 STUN DEVICE TESTING APPARATUS AND METHODS Public/Granted day:2014-01-23
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