Invention Grant
US09588173B2 Waveguides for capturing close-proximity electromagnetic radiation transmitted by wireless chips during testing on automated test equipment (ATE)
有权
用于在自动测试设备（ATE）测试期间捕获由无线芯片传输的紧密电磁辐射的波导
- Patent Title: Waveguides for capturing close-proximity electromagnetic radiation transmitted by wireless chips during testing on automated test equipment (ATE)
- Patent Title (中): 用于在自动测试设备（ATE）测试期间捕获由无线芯片传输的紧密电磁辐射的波导
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Application No.: US14108708Application Date: 2013-12-17
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Publication No.: US09588173B2Publication Date: 2017-03-07
- Inventor: Roger Isaac , Bhupendra Sarhad , Gary Davis McCormack , Ian A. Kyles , Frederick George Weiss , Christopher Scott Sansom
- Applicant: Keyssa, Inc.
- Applicant Address: US CA Campbell
- Assignee: Keyssa, Inc.
- Current Assignee: Keyssa, Inc.
- Current Assignee Address: US CA Campbell
- Agency: Fenwick & West LLP
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R1/24 ; G01R1/04 ; G01R31/302
Abstract:
A test fixture has a flexible plastic cable that acts as a waveguide. The Device-Under-Test (DUT) is a small transceiver and antenna that operate in the Extremely High-Frequency (EHF) band of 30-300 GHz. The size of the DUT transceiver is very small, limiting the power of emitted electromagnetic radiation so that close-proximity communication is used. The envelope for reception may only extend for about a centimeter from the DUT transceiver, about the same size as the test socket. A slot is formed in the test socket very near to the antenna. The slot receives one end of the plastic waveguide. The slot extends into the envelope by the DUT transceiver so that close-proximity radiation is captured by the plastic waveguide. The waveguide has a high relative permittivity and reflective metalized walls so that the radiation may be carried to a receiver that is outside the envelope.
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