Invention Grant
- Patent Title: Short-circuit inspection method for secondary cell
- Patent Title (中): 二次电池短路检查方法
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Application No.: US14417473Application Date: 2012-07-27
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Publication No.: US09588183B2Publication Date: 2017-03-07
- Inventor: Takayuki Nakayama , Akio Minakuchi
- Applicant: Takayuki Nakayama , Akio Minakuchi
- Applicant Address: JP Toyota-shi
- Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Current Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
- Current Assignee Address: JP Toyota-shi
- Agency: Sughrue Mion, PLLC
- International Application: PCT/JP2012/069187 WO 20120727
- International Announcement: WO2014/016956 WO 20140130
- Main IPC: H02J7/00
- IPC: H02J7/00 ; G01R31/36 ; G01R31/02

Abstract:
A secondary battery is charged at a predetermined charging current density to a first SOC, and discharged at a discharging current density same as the charging current density to a second SOC smaller than the first SOC, the voltage thereof is stabilized by leaving the secondary battery for a predetermined time while maintaining the secondary battery in the range of ±3° C. from the battery temperature of the secondary battery that has been discharged, the secondary battery the voltage of which has been stabilized is self-discharged under room temperature, and the presence or absence of a short-circuit is detected on the basis of a voltage drop amount after a given time.
Public/Granted literature
- US20150212162A1 SHORT-CIRCUIT INSPECTION METHOD FOR SECONDARY CELL Public/Granted day:2015-07-30
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