Invention Grant
US09588225B2 Apparatus for measuring positions of other apparatus and method therefor
有权
用于测量其他装置的位置的装置及其方法
- Patent Title: Apparatus for measuring positions of other apparatus and method therefor
- Patent Title (中): 用于测量其他装置的位置的装置及其方法
-
Application No.: US14160367Application Date: 2014-01-21
-
Publication No.: US09588225B2Publication Date: 2017-03-07
- Inventor: Seo Hyun Jeon , Min Su Jang , Dae Ha Lee , Chang Eun Lee , Hyun Ja Im , Young Jo Cho , Jae Hong Kim , Jong Hyun Park
- Applicant: Electronics and Telecommunications Research Institute
- Applicant Address: KR Daejeon
- Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Current Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Current Assignee Address: KR Daejeon
- Priority: KR10-2013-0006849 20130122
- Main IPC: G01S17/74
- IPC: G01S17/74
Abstract:
Disclosed are an apparatus for measuring position of other apparatus and a method for the same. The apparatus may comprise at least one light emitting part transmitting a photo signal, at least one light receiving part receiving a photo signal transmitted from other apparatus, and a signal processing part controlling the at least one light emitting part to transmit the photo signal including identification information of itself, acquiring identification information of the other apparatus based on the photo signal received from the other apparatus, and acquiring a positional information of the other apparatus based on the acquired identification information of the other apparatus. Thus, the apparatus located in an arbitrary space may accurately acquire relative positional information of counterpart apparatuses.
Public/Granted literature
- US20140203197A1 APPARATUS FOR MEASURING POSITIONS OF OTHER APPARATUS AND METHOD THEREFOR Public/Granted day:2014-07-24
Information query
