Invention Grant
- Patent Title: X-ray detectors
- Patent Title (中): X光检测器
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Application No.: US13853166Application Date: 2013-03-29
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Publication No.: US09588238B2Publication Date: 2017-03-07
- Inventor: Young Kim , Jun-su Lee , Sun-il Kim , Jae-chul Park , Dae-kun Yoon , Sang-wook Han
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Priority: KR10-2012-0033339 20120330
- Main IPC: G01T1/24
- IPC: G01T1/24 ; H01L27/146

Abstract:
An X-ray detector may include a silicon substrate including a first area and a second area; a plurality of pixels in the first area configured to detect X-rays; a control pad in the second area configured to supply a common control signal to the plurality of pixels; and/or a power supply pad in the first area configured to supply a power supply voltage to groups of pixels grouped from among the plurality of pixels.
Public/Granted literature
- US20130256545A1 X-RAY DETECTORS Public/Granted day:2013-10-03
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