A fast testing switch device arranged on a TFT-LCD array substrate is disclosed. The fast testing switch device switches the testing signals for testing a display area of the TFT-LCD array substrate. The fast testing switch device includes at least a first switch TFT. The gate of the first switch TFT connects to one control chip and a testing block for receiving the switch control signals from the testing block or the turn-off control signals from the control chip. The source of the first switch TFT connects to one data testing line or one gate testing line, and the drain of the first switch TFT connects to the corresponding data line or gate line of the display area. In addition, a corresponding TFT-LCD array substrate is also disclosed. The above configuration not only can achieve the narrow-bezel design but also can enhance the yield rate of the TFT-LCD array substrate.