Invention Grant
US09588444B2 Balance mass system shared by workpiece table and mask table, and lithography machine
有权
平衡质量系统由工件台和掩模台共用,以及平版印刷机
- Patent Title: Balance mass system shared by workpiece table and mask table, and lithography machine
- Patent Title (中): 平衡质量系统由工件台和掩模台共用,以及平版印刷机
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Application No.: US14437775Application Date: 2013-09-23
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Publication No.: US09588444B2Publication Date: 2017-03-07
- Inventor: Tianming Wang
- Applicant: SHANGHAI MICRO ELECTRONICS EQUIPMENT CO., LTD.
- Applicant Address: CN Shanghai
- Assignee: SHANGHAI MICRO ELECTRONICS EQUIPMENT CO., LTD.
- Current Assignee: SHANGHAI MICRO ELECTRONICS EQUIPMENT CO., LTD.
- Current Assignee Address: CN Shanghai
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: CN201210451784 20121112
- International Application: PCT/CN2013/084005 WO 20130923
- International Announcement: WO2014/071780 WO 20140515
- Main IPC: G03F7/20
- IPC: G03F7/20 ; F16F7/10 ; F16F15/00

Abstract:
A balance mass system shared by a workpiece stage and a mask stage includes a balance mass and an anti-drift and compensation apparatus (16). The balance mass includes a first part (11) for mounting thereon a workpiece stage system, a second part (20) for mounting thereon a mask stage system, and a third part (14) for interconnecting the first part (11) and the second part (20). The first part (11) of the balance mass is floatingly supported on a base frame (1) of a lithography machine, and the third part (14) of the balance mass is in connection with the base frame (1) via the anti-drift and compensation apparatus (16). The anti-drift and compensation apparatus (16) is disposed in proximity to the center of gravity of the balance mass as a whole. This balance mass system can eliminate the need for using an additional support for the mask stage system and allow the construction of a lithography machine with a higher structural compactness, reduced size and weight, and reduced total mass of used balance masses.
Public/Granted literature
- US20150286154A1 Balance Mass System Shared by Workpiece Table and Mask Table, and Lithography Machine Public/Granted day:2015-10-08
Information query
IPC分类: