Invention Grant
- Patent Title: Determination of point of interest views from selected vantage points
- Patent Title (中): 从选定的有利位置确定景点观点
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Application No.: US14869358Application Date: 2015-09-29
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Publication No.: US09589358B1Publication Date: 2017-03-07
- Inventor: James E. Bostick , John M. Ganci, Jr. , Martin G. Keen , Sarbajit K. Rakshit , Craig M. Trim
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Daniel R. Simek
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; G06F17/30

Abstract:
A three dimensional map of a designated area that includes location data and relative height data of vantage points, points of interest, and objects, within the designated area, is received. A line-of-sight view from the vantage points to the points of interest is determined by calculating an angle, a distance, and a direction between a vantage point and a point of interest based, at least in part, on the location data and relative height data associated with the three dimensional map of the designated area. Obstructions of the line-of-sight view between the vantage points and the points of interest are determined, based on the line-of-sight view, the location data, and the relative height data, and responsive to determining that the line-of-sight view is free of obstruction, identifying each point of interest viewable from each vantage points, within the designated area.
Public/Granted literature
- US20170091942A1 Determination of Point of Interest Views From Selected Vantage Points Public/Granted day:2017-03-30
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