Invention Grant
US09589489B2 Probe frame for array substrate detecting apparatus and detecting apparatus having the same
有权
用于阵列基板检测装置的探针框架和具有该探针框架的检测装置
- Patent Title: Probe frame for array substrate detecting apparatus and detecting apparatus having the same
- Patent Title (中): 用于阵列基板检测装置的探针框架和具有该探针框架的检测装置
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Application No.: US14105947Application Date: 2013-12-13
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Publication No.: US09589489B2Publication Date: 2017-03-07
- Inventor: Xing Ge , Zhen Wei , Chengda Zhu , Jian Sheng , Yuanyi Cai , Lixing Zhang , Qingsheng Li
- Applicant: BOE Technology Group Co., Ltd. , Beijing BOE Display Technology Co., Ltd.
- Applicant Address: CN Beijing CN Beijing
- Assignee: BOE Technology Group Co., Ltd.,Beijing BOE Display Technology Co., Ltd.
- Current Assignee: BOE Technology Group Co., Ltd.,Beijing BOE Display Technology Co., Ltd.
- Current Assignee Address: CN Beijing CN Beijing
- Agency: Westman, Champlin & Koehler, P.A.
- Priority: CN201210546649 20121214
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G09G3/00 ; G01R31/28 ; G09G3/36

Abstract:
The present invention discloses a probe frame for an array substrate detecting apparatus, the probe frame including a frame body and a signal distribution circuit board provided to the frame body, wherein the probe frame further includes: a circuit board provided to the frame body, the circuit board being provided with through holes, and the circuit board being provided therein with a plurality of signal transmission wires in a one to one correspondence with the through holes, one end of each signal transmission wire is inserted into its respective through hole and the other end thereof is electrically connected with an output end of the signal distribution circuit board; and a plurality of probes in a one to one correspondence with the through holes, wherein for each pair of the probe and the through hole, one end of the probe is inserted into the through hole so as to be electrically connected with the signal transmission wire within the through hole. Electrical connection between respective probes and the signal distribution circuit board are achieved through signal transmission wires in the circuit board, wiring on the probe frame is simple, and stability in signal connections between probes and the signal distribution circuit board can be improved. The present invention further provides an array substrate detecting apparatus including the above probe frame.
Public/Granted literature
- US20140167807A1 PROBE FRAME FOR ARRAY SUBSTRATE DETECTING APPARATUS AND DETECTING APPARATUS HAVING THE SAME Public/Granted day:2014-06-19
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