Invention Grant
- Patent Title: Indication method and device for measurement parameter
- Patent Title (中): 测量参数指示方法和装置
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Application No.: US14420289Application Date: 2013-06-09
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Publication No.: US09591533B2Publication Date: 2017-03-07
- Inventor: Sida Song , Yang Sun , Yun Zhu
- Applicant: ZTE CORPORATION
- Applicant Address: CN
- Assignee: ZTE CORPORATION
- Current Assignee: ZTE CORPORATION
- Current Assignee Address: CN
- Agency: Plumsea Law Group, LLC
- Priority: CN201210281716 20120809
- International Application: PCT/CN2013/077090 WO 20130609
- International Announcement: WO2013/178102 WO 20131205
- Main IPC: H04W48/16
- IPC: H04W48/16 ; H04B17/24 ; H04W48/12 ; H04W36/00

Abstract:
A method and device for indicating measurement parameters are disclosed. The method for indicating the measurement parameters includes: a base station of a serving cell acquiring frequency band usage information of neighboring cells of the serving cell; according to a frequency band used by the base station itself and the obtained frequency band usage information of all the neighboring cells, the base station of the serving cell determining measurement parameters of a mobile station which accesses the base station of the serving cell, wherein, the measurement parameters include: measurement frequency points and measurement bandwidths at all the measurement frequency points; and the base station of the serving cell indicating the measurement parameters to the mobile station which accesses the base station of the serving cell. With the method and device of the present document, a flexibility of measurement bandwidths and an accuracy of measurement can be improved.
Public/Granted literature
- US20150208296A1 Indication Method and Device for Measurement Parameter Public/Granted day:2015-07-23
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