Invention Grant
- Patent Title: Tire testing apparatus
- Patent Title (中): 轮胎试验装置
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Application No.: US14346237Application Date: 2012-12-21
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Publication No.: US09594003B2Publication Date: 2017-03-14
- Inventor: Makoto Tachibana , Jiro Agawa , Morihiro Imamura , Tatsuya Ueda , Yoshinori Miyamoto
- Applicant: MITSUBISHI HEAVY INDUSTRIES MACHINERY TECHNOLOGY CORPORATION
- Applicant Address: JP Hiroshima
- Assignee: MITSUBISHI HEAVY INDUSTRIES MACHINERY TECHNOLOGY CORPORATION
- Current Assignee: MITSUBISHI HEAVY INDUSTRIES MACHINERY TECHNOLOGY CORPORATION
- Current Assignee Address: JP Hiroshima
- Agency: Kanesaka Berner and Partners LLP
- Priority: JP2012-004503 20120112
- International Application: PCT/JP2012/083261 WO 20121221
- International Announcement: WO2013/105418 WO 20130718
- Main IPC: G01M17/00
- IPC: G01M17/00 ; G01M17/02 ; G01M1/02 ; G01B11/24 ; G01M1/32 ; G01M1/22 ; G01M1/16

Abstract:
A tire testing apparatus includes: a lower rim that is formed with a lower through hole, and a rim-side inclined surface that increases in diameter in a downward direction of an inner peripheral surface of a lower end portion of the lower through hole; an upper rim that is held to face the lower rim; an insertion part capable of being inserted through the lower through hole; and an apparatus-side inclined surface that is provided at a lower end portion of the insertion part, increases in diameter from an outer peripheral surface of the insertion part in the downward direction, and is capable of coming into contact with the rim-side inclined surface.
Public/Granted literature
- US20140230534A1 TIRE TESTING APPARATUS Public/Granted day:2014-08-21
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