Invention Grant
- Patent Title: Systems and methods for high accuracy analyte measurement
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Application No.: US13824308Application Date: 2010-12-31
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Publication No.: US09594043B2Publication Date: 2017-03-14
- Inventor: Ronald C. Chatelier , Alastair M. Hodges
- Applicant: Ronald C. Chatelier , Alastair M. Hodges
- Applicant Address: CH Switzerland
- Assignee: Cilag GmbH International
- Current Assignee: Cilag GmbH International
- Current Assignee Address: CH Switzerland
- Agency: Barclay Damon, LLP
- International Application: PCT/US2010/062629 WO 20101231
- International Announcement: WO2012/091728 WO 20120705
- Main IPC: G01N27/327
- IPC: G01N27/327 ; C12Q1/02

Abstract:
Methods for determining a concentration of an analyte in a sample, and the devices and systems used in conjunction with the same, are provided herein. In one exemplary embodiment of a method for determining a concentration of an analyte in a sample, a sample including an analyte is provided in a sample analyzing device having a working and a counter electrode. An electric potential is applied between the electrodes and a first analyte concentration is determined. A second analyte concentration value is calculated from the first analyte concentration value and corrected for temperature effects, fill time and capacitance to provide for a final analyte concentration value.
Public/Granted literature
- US09632054B2 Systems and methods for high accuracy analyte measurement Public/Granted day:2017-04-25
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