Invention Grant
US09594061B2 Methods and apparatus for detecting defects in an object of interest
有权
用于检测感兴趣对象中的缺陷的方法和装置
- Patent Title: Methods and apparatus for detecting defects in an object of interest
- Patent Title (中): 用于检测感兴趣对象中的缺陷的方法和装置
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Application No.: US14178100Application Date: 2014-02-11
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Publication No.: US09594061B2Publication Date: 2017-03-14
- Inventor: John K. Hartman , Lee H Pearson
- Applicant: Orbital ATK, Inc.
- Applicant Address: US MN Plymouth
- Assignee: Orbital ATK, Inc.
- Current Assignee: Orbital ATK, Inc.
- Current Assignee Address: US MN Plymouth
- Agency: TraskBritt
- Main IPC: G01N29/11
- IPC: G01N29/11 ; G01N29/22 ; G01N29/265 ; G01N29/34 ; G01N29/44

Abstract:
A method for detecting defects in an object of interest comprises applying an ultrasonic signal including a tone burst having a predetermined frequency and number of cycles into an object of interest, receiving a return signal reflected from the object of interest, and processing the return signal to detect defects in at least one inner material. The object may have an outer material and the at least one inner material that have different acoustic impedances. An ultrasonic sensor system includes an ultrasonic sensor configured to generate an ultrasonic signal having a tone burst at a predetermined frequency corresponding to a resonant frequency of an outer material of an object of interest.
Public/Granted literature
- US20150226705A1 METHODS AND APPARATUS FOR DETECTING DEFECTS IN AN OBJECT OF INTEREST Public/Granted day:2015-08-13
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