Invention Grant
- Patent Title: Test arrangement
- Patent Title (中): 测试安排
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Application No.: US14586167Application Date: 2014-12-30
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Publication No.: US09594106B2Publication Date: 2017-03-14
- Inventor: Paul Robert Overton
- Applicant: Viper Subsea Technology Limited
- Applicant Address: GB Bristol
- Assignee: Viper Subsea Technology Limited
- Current Assignee: Viper Subsea Technology Limited
- Current Assignee Address: GB Bristol
- Priority: GB1400402.2 20140110
- Main IPC: G01R31/11
- IPC: G01R31/11 ; G01R31/14 ; G01R31/02 ; G01R31/08

Abstract:
A test arrangement for use in determining the location of a fault in an installation 10 comprising at least first and second conductors 22, 24 providing electrical connections between a surface located device 12 and a subsea located device 20, the test arrangement comprising a first module 26 operable to apply a common test signal between ground and the first and second conductors 22, 24, and a second module 28 operable to monitor the total current flowing through the first and second conductors 22, 24 at a subsea location.
Public/Granted literature
- US20150198651A1 Test Arrangement Public/Granted day:2015-07-16
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