Invention Grant
US09594634B2 Techniques to efficiently compute erasure codes having positive and negative coefficient exponents to permit data recovery from more than two failed storage units
有权
用于有效计算具有正和负系数指数的擦除代码以允许从两个以上故障存储单元进行数据恢复的技术
- Patent Title: Techniques to efficiently compute erasure codes having positive and negative coefficient exponents to permit data recovery from more than two failed storage units
- Patent Title (中): 用于有效计算具有正和负系数指数的擦除代码以允许从两个以上故障存储单元进行数据恢复的技术
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Application No.: US14293791Application Date: 2014-06-02
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Publication No.: US09594634B2Publication Date: 2017-03-14
- Inventor: Vinodh Gopal , Erdinc Ozturk
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Barnes & Thornburg LLP
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G06F11/00 ; H03M13/15 ; H03M13/00 ; H03M13/37

Abstract:
Erasure code syndrome computation based on Reed Solomon (RS) operations in a Galois field to permit reconstruction of data of more than 2 failed storage units. Syndrome computation may be performed with coefficient exponents that consist of −1, 0, and 1. A product xD of a syndrome is computed as a left-shift of data byte D, and selective compensation based on the most significant bit of D. A product x−1D of a syndrome is computed as a right-shift of data byte D, and selective compensation based on the most significant bit of D. Compensation may include bit-wise XORing shift results with a constant derived from an irreducible polynomial associated with the Galois field. A set of erasure code syndromes may be computed for each of multiple nested arrays of independent storage units. Data reconstruction includes solving coefficients of the syndromes as a Vandermonde matrix.
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