Invention Grant
- Patent Title: Phase distribution measurement method and phase distribution measurement apparatus
- Patent Title (中): 相位分布测量方法和相位分布测量装置
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Application No.: US14189532Application Date: 2014-02-25
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Publication No.: US09594941B2Publication Date: 2017-03-14
- Inventor: Hiroshi Ishiwata
- Applicant: OLYMPUS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: OLYMPUS CORPORATION
- Current Assignee: OLYMPUS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Holtz, Holtz & Volek PC
- Priority: JP2013-059327 20130322; JP2013-242448 20131125
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01N15/14 ; G02B21/00 ; G02B21/14 ; G02B21/16 ; G02B21/36

Abstract:
A phase distribution measurement method inside a biological sample includes taking in an optical image of the sample formed by a microscope to form a plurality of images with different image contrasts; calculating a component corresponding to phase distribution of the sample and a component corresponding to other than the phase distribution, and dividing the component corresponding to the phase distribution by the component corresponding to other than the phase distribution to forma normalized phase component image; breaking down the phase component image into a plurality of frequency components; performing a deconvolution process to each of the frequency components using an optical response character corresponding to each, and calculating phase distribution of a refraction component and phase distribution of a structure component; and calculating phase distribution of the sample by compounding the phase distribution of the refraction component and the phase distribution of the structure component.
Public/Granted literature
- US20140285650A1 PHASE DISTRIBUTION MEASUREMENT METHOD AND PHASE DISTRIBUTION MEASUREMENT APPARATUS Public/Granted day:2014-09-25
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