Invention Grant
- Patent Title: Nonvolatile semiconductor memory device
- Patent Title (中): 非易失性半导体存储器件
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Application No.: US14543236Application Date: 2014-11-17
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Publication No.: US09595311B2Publication Date: 2017-03-14
- Inventor: Ryousuke Takizawa
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Tokyo
- Agency: Holtz, Holtz & Volek PC
- Main IPC: G11C11/16
- IPC: G11C11/16 ; G11C13/00 ; G11C17/16 ; G11C17/18 ; G11C29/00

Abstract:
According to one embodiment, nonvolatile semiconductor memory device comprises: a memory mat including a memory cell having a variable resistance element; a write driver which applies a write current to the memory cell in one of a first direction and a second direction opposite to the first direction in write; and a read driver which applies a verify read current to the memory cell in one of the first direction and the second direction in verify read after write.
Public/Granted literature
- US20160049186A1 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE Public/Granted day:2016-02-18
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