Invention Grant
- Patent Title: Self-examination apparatus and method for self-examination
-
Application No.: US13056125Application Date: 2010-09-09
-
Publication No.: US09596991B2Publication Date: 2017-03-21
- Inventor: Kyuhyoung Choi
- Applicant: Kyuhyoung Choi
- Applicant Address: KR Seoul
- Assignee: LG ELECTRONICS INC.
- Current Assignee: LG ELECTRONICS INC.
- Current Assignee Address: KR Seoul
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- International Application: PCT/KR2010/006122 WO 20100909
- International Announcement: WO2012/033244 WO 20120315
- Main IPC: G06F19/00
- IPC: G06F19/00 ; A61B5/00
Abstract:
The present invention relates to an apparatus and a method for a self-examination. And more particularly, the present invention relates to an apparatus and a method providing examination guide information for the self-examination.
Public/Granted literature
- US20120065476A1 SELF-EXAMINATION APPARATUS AND METHOD FOR SELF-EXAMINATION Public/Granted day:2012-03-15
Information query
