Invention Grant
- Patent Title: Machine tool including affected layer detection sensor
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Application No.: US14676067Application Date: 2015-04-01
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Publication No.: US09599445B2Publication Date: 2017-03-21
- Inventor: Ryo Ito , Naomasa Mukaide
- Applicant: JTEKT CORPORATION
- Applicant Address: JP Osaka-shi
- Assignee: JTEKT CORPORATION
- Current Assignee: JTEKT CORPORATION
- Current Assignee Address: JP Osaka-shi
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2014-078432 20140407
- Main IPC: G01B7/12
- IPC: G01B7/12 ; G01B5/016 ; B23Q17/20 ; B24B49/10 ; B23Q17/24 ; G01N27/90 ; B24B5/04

Abstract:
A machine tool including a non-contact affected layer detection sensor capable of detecting an affected layer with high precision is provided. A machine tool includes a non-contact affected layer detection sensor, a main body, probes and that contact the surface of an workpiece, arm portions supported by the main body, and dimension measurement sensors that output a signal that corresponds to the dimension of the workpiece on the basis of displacement of the arm portions with respect to the main body. The affected layer detection sensor is provided in the arm portion, and outputs a signal that corresponds to an affected state of the workpiece. The arm portions hold the probes respectively, and are displaceable with respect to the main body in accordance with the dimension of the workpiece.
Public/Granted literature
- US20150285609A1 MACHINE TOOL INCLUDING AFFECTED LAYER DETECTION SENSOR Public/Granted day:2015-10-08
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