Invention Grant
- Patent Title: Flow rate measuring device with first temperature sensor in a main passage and second temperature sensor in a sub-passage
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Application No.: US14369285Application Date: 2012-01-10
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Publication No.: US09599496B2Publication Date: 2017-03-21
- Inventor: Satoshi Asano , Masahiro Matsumoto , Hiroshi Nakano , Keiji Hanzawa , Ryosuke Doi
- Applicant: Satoshi Asano , Masahiro Matsumoto , Hiroshi Nakano , Keiji Hanzawa , Ryosuke Doi
- Applicant Address: JP Hitachinaka-shi
- Assignee: Hitachi Automotive Systems, Ltd.
- Current Assignee: Hitachi Automotive Systems, Ltd.
- Current Assignee Address: JP Hitachinaka-shi
- Agency: Crowell & Moring LLP
- International Application: PCT/JP2012/000067 WO 20120110
- International Announcement: WO2013/105124 WO 20130718
- Main IPC: G01F1/684
- IPC: G01F1/684 ; G01F1/69 ; G01F1/696 ; G01F5/00 ; G01F15/02
Abstract:
A flow rate measuring device with high precision is provided.The flow rate measuring device includes a sub-passage that takes a part of the fluid flowing in a main passage, first temperature measuring means for measuring a temperature of the fluid flowing in the passage, second temperature measuring means for measuring a temperature of a fluid flowing in the sub-passage, detecting means for detecting a flow rate of the fluid flowing in the sub-passage, and measuring means for measuring a flow rate of the fluid flowing within the main channel on the basis of an output of the first temperature measuring means, an output of the second temperature measuring means, and an output of the detecting means.
Public/Granted literature
- US20140360262A1 Flow Rate Measuring Device Public/Granted day:2014-12-11
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