Invention Grant
- Patent Title: System and method for electrostatic discharge testing of devices under test
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Application No.: US14453576Application Date: 2014-08-06
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Publication No.: US09599649B2Publication Date: 2017-03-21
- Inventor: Kyung Jin Min , David J. Pommerenke , Giorgi Muchaidze , Besarion Chikhradze , Iuri Kalandarishvili
- Applicant: Amber Precision Instruments, Inc.
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/28 ; B25J11/00 ; B25J15/00

Abstract:
A system and method for electrostatic discharge (ESD) testing devices under test (DUTs) uses an ESD gun attached to a robotic arm to execute ESD testing processes. The system and method also uses a relay station to place a DUT after an ESD testing process is performed on one major side of the DUT so the ESD testing can be performed on the other major side of the DUT.
Public/Granted literature
- US20140347079A1 SYSTEM AND METHOD FOR ELECTROSTATIC DISCHARGE TESTING OF DEVICES UNDER TEST Public/Granted day:2014-11-27
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