Invention Grant
- Patent Title: Inspection device
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Application No.: US14722746Application Date: 2015-05-27
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Publication No.: US09599659B2Publication Date: 2017-03-21
- Inventor: Keiji Tsuda
- Applicant: Keiji Tsuda
- Applicant Address: JP Tokyo
- Assignee: Ricoh Company, Ltd.
- Current Assignee: Ricoh Company, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2014-117487 20140606
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01R31/26 ; G01J1/02 ; G01J1/42

Abstract:
An inspection device is provided including a light emitting element configured to emit light, a light receiving element arranged so as to face the light emitting element and configured to receive the light, where one of the light emitting element and the light receiving element is used as a to-be-inspected element, and the other one of the light emitting element and the light receiving element is used as an inspection element that inspects the to-be-inspected element, a housing configured to accommodate the inspection element, and a lid configured to be detachable from the housing. In the inspection device, one of the housing and the lid is provided with an arrangement unit to which the to-be-inspected element is set in a detachable manner, and the lid includes a contact unit that electrically contacts the to-be-inspected element by touching and detaching from the to-be-inspected element.
Public/Granted literature
- US20150355100A1 INSPECTION DEVICE Public/Granted day:2015-12-10
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