An integrated circuit includes a scan chain, a clock divider circuit, and clock selection circuitry. The scan chain includes a plurality of dual edge flip flops, wherein each dual edge flip flop includes a data input, a scan input, a clock input, and data output. The clock divider circuit is coupled to receive a test clock and is configured to divide the test clock to provide a divided test clock. The clock selection circuitry has a first input coupled to receive the divided test clock, a second input coupled to receive a system clock, a control input coupled to receive a scan enable signal, and an output coupled to provide one of the divided test clock and the system clock as a clock signal to the clock inputs of the scan chain based on the scan enable signal.